Texas Instruments DLPNIRSCANEVM Evaluation Module
Texas Instruments DLPNIRSCANEVM Evaluation Module is a complete evaluation module to design a high-performance, affordable near-infrared spectrometer. This flexible tool contains everything a designer needs to start developing a DLP-based spectrometer right out of the box. The evaluation module features the DLP 0.45 WXGA NIR chipset, a DLP chipset optimized for use with near-infrared (NIR) light. With DLP technology, spectrometers are for use in the food, pharmaceutical, oil/gas, and other emerging industries and will deliver lab performance levels in the factory and the field.
Features
- High-performance EVM
- DLP NIRscan
- Benchtop/portable usage
- DLP4500NIR digital micromirror device
- 912x1140 pixels micromirror array size
- 7.6µm micromirror pixel pitch
- ±12° micromirror tilt angle
- 1350nm to 2490nm EVM wavelength range
- 12nm EVM spectral resolution
- 4kHz EVM maximum scan speed
- 30,000:1 EVM signal-to-noise ratio (transmissive head)
- MobileSensing EVM
- DLP NIRscan Nano
- Battery usage
- DLP2010NIR digital micromirror device
- 854x480 pixels micromirror array size
- 5.4µm micromirror pixel pitch
- ±17° micromirror tilt angle
- 900nm to 1700nm EVM wavelength range
- 10nm EVM spectral resolution
- 2.88kHz EVM maximum scan speed
- 6,000:1 EVM signal-to-noise ratio (reflective head)
Kit Contents
- Spectrometer optical engine featuring DLP4500NIR DMD
- Single-element extended InGaAs detector
- Driver electronics featuring DLPC350 DMD controller, AM3358 processor, and ADS1255 ADC
- Transmittance sampling module with halogen lamp
- 3x disposable cuvettes
- Embedded Linux operating system and web server based on BeagleBone Black architecture
- Power supply sold separately
Block Diagram
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게시일: 2016-01-08
| 갱신일: 2025-03-06